Czasopismo | ELEKTRONIKA - KONSTRUKCJE, TECHNOLOGIE, ZASTOSOWANIA | Rocznik 2011 - zeszyt 12

An analogue electronic circuits specification driven testing with the use of time domain response’s features

nr katalogowy: 64780

Analogue electronic circuits testing is undoubtedly a very complex issue [1, 6, 7]. It has been absorbing electronic engineers for past decades. The difficulty of this problem is caused mainly by the non-deterministic nature of component parameters, limited controllability and observability. Additional problems are difficulties in creating a standardised fault model, variety of analogue signals and analogue electronic systems. A good proof of the analogue test complexity is the fact there still is not a single, algorithmically described method of creating such tests. It is also a reason for research in this area [3, 8, 9, 11]. Analogue testing is usually divided into two categories, i.e. fault (structural) driven test - FDT methods - and specification (functional) driven test - SDT methods. The former employs complex fault models and is oriented on finding, through multiple circuit’s simulations, the influence of each of assumed faults on the circuits performance under given excitations. The latter is focused on measuring a certain circuit’s performance specifications, e.g. cut-off frequency, DC gain, and the like, and determining the results of GO/NO-GO test (“pass" or “fail") under the condition of all specifications are withing assumed boundaries. As far as it is possible and reasonably simple to execute all required measurements at the test stage, this solution is usually unacceptable due to required time and equipment [1]. Testing methods are also divided according to the stage most of the computation is done [1]. There are two main categories, i.e. methods with the simulation at the before test stage (SBT method) and methods with the simulation at the after test stage (SAT methods). The former group is characterised with the computation time shifted toward the test design stage, when all of required circuit simulations are executed, a fault dictionary is created, etc. In the latter - the measureme[...]

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2011-12

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