Czasopismo | INŻYNIERIA MATERIAŁOWA | Rocznik 2010 - zeszyt 3

Application of EFTEM and FIB electron tomography to 3D visualization and metrology of nanoparticles in Inconel 718 superalloy

nr katalogowy: 52750

Inconel 718 (IN718) is one of the most common precipitation-hardened Ni-base superalloys. It belongs to a class of Ni-Fe superalloys, containing a relatively high content of Fe as well as Ti and Al to provide γ′, Ni3(Ti, Al) precipitates. It also contains Nb which leads to precipitation of the tetragonal Ni3Nb phase (γ") [1]. A disadvantage is that the γ" precipitates have a worse thermal stability than γ′ leading to a faster coarsening rate and to a gradual transformation to an orthorhombic phase of Ni3Nb (δ) above about 800°C. This limits the use of the alloy to below about 650°C. The γ" phase occurs in the form of as elongated, oriented particles (disc-shaped) within the γ matrix, while the γ′ precipitates are spherical [1, 2]. Transmission electron microscopy (TEM) images give valuable information about the microstructure and chemical composition of materials. However, they “only" provide a 2D projection of a 3D object. Electron tomography was developed to reconstruct objects in three dimensions (3D) from a tilt series of TEM images. This technique is well accepted in the life sciences as a method used to study viruses or cells. The resolution in the reconstructions, however, is limited to a few nanometers. Electron tomography techniques have recently been adopted by researchers in materials science [2]. In practice, however, the resolution is still of the order of one to two nanometers because of the limited stability of the sample holders and the presence of dynamic diffraction in crystalline solids. Electron tomography is a technique that uses a transmission electron microscope (TEM) to determine a 3D structure from any given asymmetric object [3]. This process can be simply broken down into 4 steps. First, a series of 2D projection images of the specimen are recorded and systematically tilted to different angles in the microscope. Second, these individual im[...]

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