Czasopismo | INŻYNIERIA MATERIAŁOWA | Rocznik 2010 - zeszyt 3

Ultra-fine grain structure of AA3104 alloy analyzed by TEM and SEM orientation mappings

nr katalogowy: 52730

It has been frequently shown that the application of electron backscattered diffraction (EBSD) and high resolution scanning electron microscopy (SEMFEG) to structure and texture analyses of cold deformed and/or lightly annealeded materials gives reasonable results only up to moderate strains (~1.5). In the case of higher deformations, the resolution of SEM/EBSD technique is not always sufficient. The application of systems of local orientation measurements based on transmission electron microscopy (TEM) is one of the ways towards the solution of the problem. Because of the good spatial resolution (which is usually estimated to be below 10 nm [1]) and the accuracy of orientation determination (better than 0.1°) the local orientation measurements in TEM appears to be the suitable method for the investigation of fine grained structures. Recent studies leading to designing a fully automatic TEM system are focused on automatic indexation of transmission Kikuchi bands, e.g. [2÷5]. The application of fully automatic indexing in TEM is more difficult than in the case of SEM mainly due to smaller acquisition angle and higher indices of the diffraction planes as well as because of poorer quality of diffraction patterns. The latter ‘parameter’ depends not only on the dislocation density (surface strains) but also specimen thickness. Moreover, according to Schwarzer [2] the accuracy of the system by the use of automatic indexing was proved up to 0.5°, whereas it is only 0.1° by manual indexing. Thus manual indexing is still widely used for accurate determination of crystallographic orientations. They are other problems related to the acquisition time and long range drift. The pattern acquisition is still the main factor determining the time needed for map creation (usually ~25÷30 patterns per minute). Additionally, the intensities in the original patterns significantly decrease with the distance from the center of the image. Th[...]

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