Czasopismo | INŻYNIERIA MATERIAŁOWA | Rocznik 2016 - zeszyt 5

Efficiency of chemometric methodology for characterization of In/CuPc films on HOPG and InSb based on ultraviolet photoelectron spectra

10.15199/28.2016.5.5

nr katalogowy: 101852
10.15199/28.2016.5.5

Photoemission spectroscopy offers the possibility to study on the interface formation of copper phthalocyanine exposed to indium. In this paper, we demonstrate the potential of using chemometric treatment in the characterization of In/CuPc films on HOPG and InSb substrates based on ultraviolet photoelectron spectra (UPS). The main advantage of using chemometric methods is that there is no need to construct of line intensities models to gain valuable information. The experimental data sets have a bilinear mathematical structure and, therefore, they can be subjected to principal component analysis (PCA). The results of PCA showed that the principal component loadings provide useful information about the changes in the line intensities and the peak positions. The obtained graphical models of data, in a simple way, enabled the determination of new supplementary information concerning the role of the individual chemical compounds in terms of In/CuPc interface formation. Moreover, chemometric classification method such as cluster analysis (CA) allowed identifying the subgroups of samples according to a specific property of formed components. Key words: metal-organic interfaces, copper phthalocyanine, chemometrics.1. INTRODUCTION Among the wide range of metal-organic semiconductor interfaces which has been reported in the literature, the phthalocyanines family has received a lot of attention due to their biological significance, catalytic properties and technological interest. Copper phthalocyanine often referred to as CuPc, is well known material for their semiconducting behaviour. The nature of its chemical and electronic structure has been the topic of numerous research in recent years [1÷4]. A great deal of the attention has been paid for studying interface formation at deposition of different metals on CuPc thin films, due to their promising optical and electrical properties [5÷8]. Several papers refer to interface formation between copper[...]

Bibliografia

[1] Szuber J., Grządziel L.: Photoemission study of the electronic properties of in situ prepared copper phthalocyanine (CuPc) thin films exposed to oxygen and hydrogen. Thin Solid Films 391 (2001) 282÷287.
[2] Kera S., Yamane H., Sakuragi I., Okudaira K. K., Ueno N.: Very narrow photoemission bandwidth of the highest occupied state in a copper-phthalocyanine monolayer. Chem. Phys. Lett. 364 (2002) 03÷98.
[3] Downes J. E., McGuinness C., Glans P. A., Learmonth T., Fu D., Sheridan P., Smith K. E.: Electronic structure near the Fermi level of the organic semiconductor copper phthalocyanine. Chem. Phys. Lett. 390 (2004) 203÷207.
[4] Aristov V. Y., Molodtsova O. V., Maslyuk V., Vyalikh D. V., Zhilin V. M., Ossipyan Y. A., Bredow T., Mertig I., Knupfer M.: Electronic structure of pristine CuPc: Experiment and calculations. App. Surf. Sci. 254 (2007) 20÷25.
[5] Kera S., Yabuuchi Y., Yamane H., Setoyama H., Okudaira K. K., Kahn A., Ueno N.: Impact of an interface dipole layer on molecular level alignment at an organic-conductor interface studied by ultraviolet photoemission spectroscopy. Phys. Rev. B 70 (2004) 085304-1÷085304-6.
[6] Molodtsova O. V., Aristov V. Y., Zhilin V. M., Ossipyan Y. A., Vyalikh D. V., Doyle B. P., Nannarone S., Knupfer M.: Silver on copper phthalocyanine: Abrupt and inert interfaces. App. Surf. Sci. 254 (2007) 99÷102.
[7] Haidu F., Salvan G., Zahn D. R. T., Smykalla L., Hietschold M., Knupfer M.: Transport band gap opening at metal-organic interfaces. J. Vac. Sci. Technol. A 32 (4) (2014) 040602-1÷040602-7.
[8] Krzywiecki M., Grządziel L.: Energy level alignment at the Si (111)/ RCA-SiO2/copper(II) phthalocyanine ultra-thin film interface. App. Surf. Sci. 311 (2014) 740÷748.
[9] Aristov V. Y., Molodtsova O. V., Zhilin V. M., Vyalikh D. V., Knupfer M.: Chemistry and electronic properties of a metal-organic semiconductor interface: In on CuPc. Phys. Rev. B 72 (2005) 165318-1÷165318-7.
[10] Ivanco J., Toader T., Frisov A., Brzhezinskaya M., Sperling M., Braun W., Zahn D. R. T.: Indium on a copper phthalocyanine thin film: Not a reactive system. Phys. Rev B 81 (2010) 115325-1÷115325-8.
[11] Gaarenstroom S. W.: Application of Auger line shapes and factor analysis to characterize a metal-ceramic interfacial reaction. J. Vac. Sci. Technol. 20 (1982) 458÷461.
[12] Siuda R., Balcerowska G.: Application of principal component and factor analyses in electron spectroscopy. Electron Tech. 31 (3/4) (1998) 487÷494.
[13] Artyushkova K., Fulghum J. E.: Identification of chemical components in XPS spectra and images using multivariate statistical methods. J. Electron Spectrosc. Relat. Phenom. 121 (2001) 33÷55.
[14] Aronniemi M., Sainio J., Lahtinen J.: Aspects of using factor analysis for XPS data interpretation. Surf. Sci. 601 (2007) 479÷489.
[15] Kera S., Ueno N.: Deep insight into a valence hole in organic semiconductors: High-resolution ultraviolet photoemission study. IPAP Conf. Ser. 6 (2005) 51÷56.
[16] Evans D. A., Steiner H. J., Middleton R., Jones T. S., Chen C. H., Horn K., Park S., Kampen T. U., Tenne D., Zahn D. R. T., Patchett A., McGovern L. T.: In-situ monitoring of the growth of copper phthalocyanine films on InSb by organic molecular beam deposition. Appl. Surf. Sci. 175-176 (2001) 374÷378.
[17] Leznoff C. C., Lever A. B. P. (ed.): Phthalocyanines. Properties and applications. Vol. 1. VCH, New York (1989).
[18] Jolliffe I. T.: Principal component analysis. Springer Verlag, New York, Berlin, Heidelberg, Tokyo (1986).
[19] Massart D. L., Vandeginste B. G. M., Buydens L. M. C., De Jong S., Lewi P. J., Smeyers-Verbeke J.: Handbook of chemometrics and qualimetrics: Part A and B. Elsevier Science B.V., Amsterdam (1997).
[20] Malinowski E. R., Howery D. G.: Factor analysis in chemistry (2nd edn.). Wiley, New York (1992).
[21] Ward J. H. J.: Hierarchical grouping to optimize an objective function. Journal of the American Statistical Association 58 (301) (1963) 235÷244.
[22] Brereton R. G., Gurden S. P., Groves J. A.: Use of eigenvalues for determining the number of components in window factor analysis of spectroscopic and chromatographic data. Chemom. Intell. Lab. Syst. 27 (1995) 73÷87.
[23] Siuda R., Balcerowska G., Aberdam D.: Spurious principal components in the set of spectra subjected to disturbances. I Presentation of the problem. Chemom. Intell. Lab. Syst. 40 (1998) 193÷201.

Jeśli masz wykupiony/przyznany dostęp - zaloguj się. Skorzystaj z naszych propozycji zakupu!

Publikacja


e-Publikacja (format pdf) - nr 101852 "Efficiency of chemometric..." licencja: Osobista Produkt cyfrowy	10.00 zł

Zeszyt


INŻYNIERIA MATERIAŁOWA - e-zeszyt (pdf) 2016-5 licencja: Osobista Produkt cyfrowy	65.00 zł

Prenumerata

INŻYNIERIA MATERIAŁOWA - prenumerata cyfrowa
licencja: Osobista

Produkt cyfrowy
Nowość

402.00 zł

INŻYNIERIA MATERIAŁOWA - papierowa prenumerata roczna + wysyłka
licencja: Osobista

Szczegóły pakietu

Nazwa
INŻYNIERIA MATERIAŁOWA - papierowa prenumerata roczna	492.00 zł brutto 455.56 zł netto 36.44 zł VAT (stawka VAT 8%)
INŻYNIERIA MATERIAŁOWA - pakowanie i wysyłka	21.00 zł brutto 17.07 zł netto 3.93 zł VAT (stawka VAT 23%)

513.00 zł

INŻYNIERIA MATERIAŁOWA - PAKIET prenumerata PLUS
licencja: Osobista

Szczegóły pakietu

Nazwa
INŻYNIERIA MATERIAŁOWA - PAKIET prenumerata PLUS (Prenumerata papierowa + dostęp do portalu sigma-not.pl + e-prenumerata)	600.00 zł brutto 555.56 zł netto 44.44 zł VAT (stawka VAT 8%)

600.00 zł

Zeszyt

2016-5

Twój Koszyk

Publikacja

Zeszyt

Prenumerata

Zeszyt

Czasopisma